The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake; Tatsuya Miyazaki; Ryoji Yoshitake; Yoshihiko Nakano

doi:10.1889/1.2036454

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake, Tatsuya Miyazaki, Ryoji Yoshitake, Yoshihiko Nakano

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

Original language	English
Article number	P-178
Pages (from-to)	390-393
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	36
Issue number	1
DOIs	https://doi.org/10.1889/1.2036454
Publication status	Published - 2005
Externally published	Yes
Event	SID Symposium Digest of Technical Papers - Boston, MA, United States Duration: 2004 Jul 29 → 2004 Jul 29

ASJC Scopus subject areas

Engineering(all)

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10.1889/1.2036454

Cite this

@article{5a73512a4456490e86297246372c5bc5,

title = "The number of sub-pixel defects that is acceptable for various panel size and pixel sizes",

abstract = "User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.",

author = "Yuzo Hisatake and Tatsuya Miyazaki and Ryoji Yoshitake and Yoshihiko Nakano",

year = "2005",

doi = "10.1889/1.2036454",

language = "English",

volume = "36",

pages = "390--393",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

number = "1",

note = "SID Symposium Digest of Technical Papers ; Conference date: 29-07-2004 Through 29-07-2004",

}

TY - JOUR

T1 - The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

AU - Hisatake, Yuzo

AU - Miyazaki, Tatsuya

AU - Yoshitake, Ryoji

AU - Nakano, Yoshihiko

PY - 2005

Y1 - 2005

N2 - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

AB - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

UR - http://www.scopus.com/inward/record.url?scp=32144458945&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=32144458945&partnerID=8YFLogxK

U2 - 10.1889/1.2036454

DO - 10.1889/1.2036454

M3 - Conference article

AN - SCOPUS:32144458945

SN - 0097-966X

VL - 36

SP - 390

EP - 393

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

M1 - P-178

T2 - SID Symposium Digest of Technical Papers

Y2 - 29 July 2004 through 29 July 2004

ER -

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Abstract

ASJC Scopus subject areas

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