Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I. Kirkl, P. D. Nellist, M. Takeguchi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Jun 1

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