Abstract
Two-dimensional simulation of cutoff frequency (fT) characteristics in collector-up AlGaAs/GaAs heterojunction bipolar transistors is performed for various collector widths and different base-electrode positions. By putting the base electrode closer to the intrinsic collector, the degradation in fT resulting from the so-called carrier-blocking effect is shown to be suppressed.
Original language | English |
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Pages (from-to) | 1436-1437 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 34 |
Issue number | 14 |
DOIs | |
Publication status | Published - 1998 Jul 9 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering