Original language | English |
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Pages (from-to) | 698-703 |
Journal | IEEE Trans. Electron Devices |
Volume | 58 |
Publication status | Published - 2011 Mar 1 |
Two-dimensional analysis of field-plate effects on surface state-related current transients and power slump in GaAs FETs
K. Horio, T. Tanaka, K. Itagaki, A. Nakajima
Research output: Contribution to journal › Article › peer-review
28
Citations
(Scopus)