Original language | English |
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Pages (from-to) | 617-624 |
Journal | IEEE Trans. Electron Devices |
Volume | 47 |
Publication status | Published - 2000 Mar 1 |
Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s
K.Horio K.Horio, A.Wakabayashi A.Wakabayashi, T.Yamada T.Yamada, Kazushige Horio
Research output: Contribution to journal › Article › peer-review
28
Citations
(Scopus)