Two-Dimensional Simulation of Gate-Lag Phenomena in GaAs MESFETs and AlGaAs / GaAs HEMTS

K.Horio K.Horio, A.Wakabayashi A.Wakabayashi, N.Kurosawa N.Kurosawa, Kazushige Horio

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)339-342
JournalInstitute of Physics Conference Series
VolumeVol.166
Publication statusPublished - 2000 Apr 1

Cite this