@inproceedings{155f56c7642049319a31a8c983e9b28b,
title = "Two-dimensional simulation of surface-state effects on breakdown characteristics of narrowly-recessed-gate GaAs MESFETs",
abstract = "Effects of surface states on breakdown characteristics of narrowly-recessed-gate GaAs MESFETs are studied by two-dimensional simulation. Particularly, it is discussed how the characteristics depend on the surface-state densities and on the recess structure parameters. It is shown that the breakdown voltage could be raised when moderate densities of surface states are included. However, it is suggested that in a case with relatively high densities of surface states, the breakdown voltage could be drastically lowered by introducing a narrowly-recessed-gate structure.",
keywords = "2D simulation, Breakdown characteristics, GaAs MESFET, Recessed-gate structure, Surface state",
author = "Y. Mitani and A. Wakabayashi and K. Horio",
year = "2002",
month = dec,
day = "1",
language = "English",
isbn = "0970827571",
series = "2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002",
pages = "580--583",
editor = "M. Laudon and B. Romanowicz",
booktitle = "2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002",
note = "2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002 ; Conference date: 21-04-2002 Through 25-04-2002",
}