What is the essence of Vfb shifts in high-k gate stack?

T.Nabatame T.Nabatame, K.Iwamoto K.Iwamoto, K.Akiyama K.Akiyama, Y.Nunoshige Y.Nunoshige, H.Nunoshige H.Nunoshige, H.Ota H.Ota, A.Toriumi A.Toriumi, T.Ohishi T.Ohishi, Tomoji Oishi

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)
Original languageEnglish
Pages (from-to)543
JournalElectrochemical Society (ECS) Transactions
Publication statusPublished - 2007 Oct 7

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