弓野 健太郎

研究成果

年別の研究成果 1970 1996 2002 2003 2004 2005 2023

• 158 Article
• 7 Conference article
• 5 Conference contribution
• 2 Paper
• 2 その他
  • 1 Comment/debate
  • 1 Review article

年別の研究成果

年別の研究成果

検索結果

• 2018

  Ar-plasma-modulated optical reset in the SiO₂/Cu conductive-bridge resistive memory stack

  Kawashima, T., Yew, K. S., Zhou, Y., Ang, D. S., Zhang, H. Z. & Kyuno, K., 2018, ECS Transactions. Shingubara, S., Karim, Z., Kobayashi, K., Magyari-Kope, B., Shima, H., Saito, Y., Park, J. G., Bersuker, G., Kubota, H., Hacker, C. & Obeng, Y. S. (eds.). 3 ed. Electrochemical Society Inc., p. 55-64 10 p. (ECS Transactions; vol. 86, no. 3).

  研究成果: Conference contribution

  • Plasmas 100%
  • Ions 99%
  • Oxides 93%
  • Oxygen vacancies 83%
  • Vacancies 73%
• 2007

  Mechanisms of and solutions to moisture absorption of lanthanum oxide as high k gate dielectric

  Zhao, Y., Kita, K., Kyuno, K. & Toriumi, A., 2007, ECS Transactions - International Symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-based CMOS: New Materials, Processes and Equipment, 3. 1 ed. Electrochemical Society Inc., p. 141-148 8 p. (ECS Transactions; vol. 6, no. 1).

  研究成果: Conference contribution

  • Lanthanum oxides 100%
  • Gate dielectrics 77%
  • Moisture 47%
  • Oxygen vacancies 33%
  • Ozone 27%
  9 被引用数 (Scopus)
• 2006

  Higher-k LaYOx films with strong moisture-robustness

  Zhao, Y., Kita, K., Kyuno, K. & Toriumi, A., 2006, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. IEEE Computer Society, p. 427-429 3 p. 4098126. (ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings).

  研究成果: Conference contribution

  • Permittivity 100%
  • Moisture 86%
  • Rare earths 24%
  • Density (specific gravity) 24%
  • Oxides 17%
• 2005

  Energy level consideration of source/channel/drain for performance enhancements of N- and P-channel organic FETs

  Yokoyama, T., Nishimura, T., Kita, K., Kyuno, K. & Toriumi, A., 2005 12月 1, 63rd Device Research Conference Digest, DRC'05. p. 107-108 2 p. 1553078. (Device Research Conference - Conference Digest, DRC; vol. 2005).

  研究成果: Conference contribution

  • Electron energy levels 100%
  • Field effect transistors 92%
  • Organic field effect transistors 44%
  • Electrodes 30%
  • Spectroscopic ellipsometry 24%
• 2003

  Further EOT scaling of Ge/HfO₂ over Si/HfO₂ MOS systems

  Kita, K., Sasagawa, M., Tomida, K., Tohyama, M., Kyuno, K. & Toriumi, A., 2003, Extended Abstracts of International Workshop on Gate Insulator, IWGI 2003. Institute of Electrical and Electronics Engineers Inc., p. 186-191 6 p. 1252534. (Extended Abstracts of International Workshop on Gate Insulator, IWGI 2003).

  研究成果: Conference contribution

  • Electric properties 100%
  • Physical properties 84%
  • Electrical Property 78%
  6 被引用数 (Scopus)