弓野 健太郎

研究成果

年別の研究成果 1970 1996 2002 2003 2004 2005 2023

• 158 Article
• 7 Conference article
• 5 Conference contribution
• 2 Paper
• 2 その他
  • 1 Comment/debate
  • 1 Review article

年別の研究成果

年別の研究成果

検索結果

• Atomic jumps in surface self-diffusion: W on W(110)

  S.M.Oh, S. M. O., K.Kyuno, K. K., S.J.Koh, S. J. K., G.Ehrlich, G. E. & Kyuno, K., 2002 4月 1, In: Physical Review B. 66

  研究成果: Article › 査読

  4 被引用数 (Scopus)

• Atomic jumps in surface self-diffusion: W on W(110)

  Oh, S. M., Kyuno, K., Koh, S. J. & Ehrlich, G., 2002 1月 1, In: Physical Review B - Condensed Matter and Materials Physics. 66, 23, p. 1-4 4 p.

  研究成果: Article › 査読

  • Self-Diffusion 100%
  • surface diffusion 87%
  • Atoms 82%
  • Displacement 64%
  • Ion microscopes 51%
  3 被引用数 (Scopus)

• Atomic jumps in surface self-diffusion: W on W(110)

  Oh, S. M., Kyuno, K., Koh, S. J. & Ehrlich, G., 2002 12月 15, In: Physical Review B - Condensed Matter and Materials Physics. 66, 23, p. 2334061-2334064 4 p., 233406.

  研究成果: Article › 査読

  • Self-Diffusion 100%
  • surface diffusion 87%
  • Atoms 82%
  • Displacement 64%
  • Ion microscopes 51%
  12 被引用数 (Scopus)

• Argon-plasma-controlled optical reset in the SiO₂/Cu filamentary resistive memory stack

  Kawashima, T., Yew, K. S., Zhou, Y., Ang, D. S., Zhang, H. Z. & Kyuno, K., 2018 5月 21, In: Applied Physics Letters. 112, 21, 213505.

  研究成果: Article › 査読

  • argon plasma 100%
  • oxides 53%
  • oxygen 38%
  • oxygen ions 23%
  • surface treatment 22%
  4 被引用数 (Scopus)

• Anomalous Growth Temperature Dependence of the Surface Roughness of Pentacene Thin Films

  Tejima, M., Kita, K., Kyuno, K. & Toriumi, A., 2003 9月 1, In: Extended Abstracts of 2003 International Conference on Solid State Devices and Materials (SSDM). p. 214-215

  研究成果: Article › 査読

• A New Characterization Technique for Depth-Dependent Dielectric Properties of High-k Films by Open-Circuit Potential Measurement

  Kita, K., Sasagawa, M., Kyuno, K. & Torium, A., 2003 3月 1, In: 2003 Int. Conference on Characterization and Metrology for ULSI Technology； AIP Conf. Proceedings 550. p. 166-170

  研究成果: Article › 査読

• Advantages of Ge (111) Surface for High Quality HfO2/Ge Interface

  Toyama, M., Kita, K., Kyuno, K. & Toriumi, A., 2004 9月 1, In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). p. 226-227

  研究成果: Article › 査読

• Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique

  Yokoyama, T., Nishimura, T., Kita, K., Kyuno, K. & Toriumi, A., 2004 9月 1, In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). p. 856-857

  研究成果: Article › 査読