弓野 健太郎

研究成果

年別の研究成果 1970 1996 2002 2003 2004 2005 2023

• 158 Article
• 7 Conference article
• 5 Conference contribution
• 2 Paper
• 2 その他
  • 1 Comment/debate
  • 1 Review article

年別の研究成果

年別の研究成果

検索結果

• 1997

  Step-edge barriers: Truths and kinetic consequences

  Kyuno, K. & Ehrlich, G., 1997, In: Surface Science. 383, 2-3, p. L766-L774

  研究成果: Article › 査読

  • Atoms 100%
  • Crystal Growth 94%
  • Crystal growth 67%
  • kinetics 57%
  • atoms 39%
  4 被引用数 (Scopus)

• Step-edge barriers : Truth and kinetic consequences

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 1997 4月 1, In: Surface Science. 383

  研究成果: Article › 査読
• 1998

  Growth and the diffusion of platinum atoms and dimers on Pt(111)

  Kyuno, K., Gölzhäuser, A. & Ehrlich, G., 1998 2月, In: Surface Science. 397, 1-3, p. 191-196 6 p.

  研究成果: Article › 査読

  • Dimers 100%
  • Platinum 77%
  • Atoms 68%
  • platinum 64%
  • dimers 60%
  20 被引用数 (Scopus)

• Growth and the diffusion of Pt clusters on Pt(111)

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 1998 4月 1, In: Materials Research Society.

  研究成果: Article › 査読

• Step-edge barriers on pt(111): An atomistic view

  Kyuno, K. & Ehrlich, G., 1998 1月 1, In: Physical Review Letters. 81, 25, p. 5592-5595 4 p.

  研究成果: Article › 査読

  • escape 100%
  • platinum 99%
  • ion microscopes 71%
  • deduction 64%
  • adatoms 52%
  51 被引用数 (Scopus)

• Step-edge barriers on Pt(111) : An atomistic view

  Kyuno, K. & Ehrlich, G., 1998 12月 21, In: Physical Review Letters. 85, p. 5592

  研究成果: Article › 査読

  18 被引用数 (Scopus)

• 金属薄膜のエピタキシャル成長における素過程の直接観察

  Kyuno, K. & Ehrlich, G., 1998 4月 1, In: Physical Review Letters. 81

  研究成果: Article › 査読
• 1999

  Defects and morphologies produced by keV ion bombardment of Ge and Si surfaces

  D.G.Cahill, D. G. C., J.Kim, J. K., K.Kyuno, K. K., R.S.Averback, R. S. A. & Kyuno, K., 1999 4月 1, In: Materials Research Society.

  研究成果: Article › 査読

• Diffusion and dissociation of platinum clusters on Pt(111)

  Kyuno, K. & Ehrlich, G., 1999 8月 20, In: Surface Science. 437, 1, p. 29-37 9 p.

  研究成果: Article › 査読

  • Platinum 100%
  • Diffusion barriers 84%
  • platinum 83%
  • dissociation 70%
  • Dissociation 61%
  63 被引用数 (Scopus)

• Diffusion and dissociation of Pt clusters on Pt(111)

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 1999 4月 1, In: Surface Science. 437

  研究成果: Article › 査読

• Direct observation of interlayer transport on Pt(111)

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 1999 4月 1, In: Transactions of the Materials Research Society of Japan 24 (1999) 101.

  研究成果: Article › 査読

• First-principles calculations of the magneto-optical Kerr effect in L10-type ordered alloys TM-X (TM=Mn,Fe,Co,X=Pt,Au)

  M.Yamaguchi, M. Y., T.Kusakabe, T. K., K.Kyuno, K. K., S.Asano, S. A. & Kyuno, K., 1999 4月 1, In: Physica B. 270

  研究成果: Article › 査読

  11 被引用数 (Scopus)

• First-principles calculations of the magneto-optical Kerr effect in L1₀-type ordered alloys TM-X (TM = Mn, Fe, Co, X = Pt, Au)

  Yamaguchi, M., Kusakabe, T., Kyuno, K. & Asano, S., 1999 10月 1, In: Physica B: Condensed Matter. 270, 1-2, p. 17-34 18 p.

  研究成果: Article › 査読

  • Optical Kerr effect 100%
  • Electronic structure 70%
  • Electrooptical Effect 68%
  • Kerr effects 51%
  • Optical transitions 50%
  11 被引用数 (Scopus)

• Microscopy of Si(001) surface defects produced by keV He ion irradiation at low temperatures

  K.Kyuno, K. K., D.G.Cahill, D. G. C., R.S.Averback, R. S. A., J.Tarus, J. T., K.Nordlund, K. N. & Kyuno, K., 1999 10月 1, In: American Vacuum Society.

  研究成果: Article › 査読

• Si(001) surface morphology during SiGe alloy growth

  R.M.Tromp, R. M. T., D.G.Cahill, D. G. C., K.Kyuno, K. K. & Kyuno, K., 1999 4月 1, In: Materials Research Society.

  研究成果: Article › 査読

• Surface defects and bulk defect migration produced by ion bombardment of Si(001)

  K.Kyuno, K. K., D.G.Cahill, D. G. C., R.S.Averback, R. S. A., J.Tarus, J. T., K.Nordlund, K. N. & Kyuno, K., 1999 4月 1, In: Physical Review Letters. 83

  研究成果: Article › 査読

• Surface defects and bulk defect migration produced by ion bombardment of Si(001)

  Kyuno, K., Cahill, D. G., Averback, R. S., Tarus, J. & Nordlund, K., 1999 1月 1, In: Physical Review Letters. 83, 23, p. 4788-4791 4 p.

  研究成果: Article › 査読

  • surface defects 100%
  • bombardment 85%
  • adatoms 69%
  • defects 50%
  • ions 42%
  33 被引用数 (Scopus)

• 超高真空極低温ＳＴＭによるＳｉの格子間原子の拡散に関する研究

  Kyuno, K., Cahill, D. G., Averback, R. S., Tarus, J. & Nordlund, K., 1999 4月 1, In: Physical Review Letters. 83

  研究成果: Article › 査読
• 2000

  Cluster diffusion and dissociation in the kinetics of layer growth: An atomic view

  Kyuno, K. & Ehrlich, G., 2000, In: Physical Review Letters. 84, 12, p. 2658-2661 4 p.

  研究成果: Article › 査読

  • dissociation 100%
  • kinetics 72%
  • ion microscopes 28%
  • interlayers 18%
  • differential equations 16%
  15 被引用数 (Scopus)

• Cluster diffusion and dissociation in the kinetics of layer growth

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 2000 4月 1, In: Physical Review Letters. 84

  研究成果: Article › 査読

  10 被引用数 (Scopus)
• 2001

  Cluster diffusion and dissociation in growth kinetics

  Kyuno, K., 2001 4月 1, In: Bulletin of the American Physical Society.

  研究成果: Article › 査読

• Field-Dependent Mobility of Highly-Oriented Pentacene (C22H14) Thin Film FETs

  Komoda, T., Endo, Y., Kyuno, K. & Toriumi, A., 2001 9月 1, In: Extended Abstracts of 2001 International Conference on Solid State Devices and Materials (SSDM). p. 398-399

  研究成果: Article › 査読
• 2002

  Atomic jumps in surface self-diffusion: W on W(110)

  Oh, S. M., Kyuno, K., Koh, S. J. & Ehrlich, G., 2002 12月 15, In: Physical Review B - Condensed Matter and Materials Physics. 66, 23, p. 2334061-2334064 4 p., 233406.

  研究成果: Article › 査読

  • Self-Diffusion 100%
  • surface diffusion 87%
  • Atoms 82%
  • Displacement 64%
  • Ion microscopes 51%
  12 被引用数 (Scopus)

• Atomic jumps in surface self-diffusion: W on W(110)

  Oh, S. M., Kyuno, K., Koh, S. J. & Ehrlich, G., 2002 1月 1, In: Physical Review B - Condensed Matter and Materials Physics. 66, 23, p. 1-4 4 p.

  研究成果: Article › 査読

  • Self-Diffusion 100%
  • surface diffusion 87%
  • Atoms 82%
  • Displacement 64%
  • Ion microscopes 51%
  3 被引用数 (Scopus)

• Atomic jumps in surface self-diffusion: W on W(110)

  S.M.Oh, S. M. O., K.Kyuno, K. K., S.J.Koh, S. J. K., G.Ehrlich, G. E. & Kyuno, K., 2002 4月 1, In: Physical Review B. 66

  研究成果: Article › 査読

  4 被引用数 (Scopus)

• Cluster diffusion on Pt(111)

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 2002 4月 1, In: Surface Science. 511

  研究成果: Article › 査読

• Field-dependent mobility of highly oriented pentacene thin-film transistors

  Komoda, T., Endo, Y., Kyuno, K. & Toriumi, A., 2002 4月, In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 41, 4 B, p. 2767-2769 3 p.

  研究成果: Article › 査読

  • Thin film transistors 100%
  • Vacuum evaporation 70%
  • transistors 62%
  • Film growth 62%
  • Carrier transport 60%
  34 被引用数 (Scopus)

• Field Ion Microscopy on Surface Processes

  K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 2002 4月 1, In: Encyclopedia of Surface and Colloid Scienc.

  研究成果: Article › 査読

• Graphical Approach to Sensitive Detection of Interface Defects in Thin Oxide MOS Capacitors

  Kita, K., Osaka, Y., Kyuno, K., Takagi, S., Takasaki, K., Kubota, M., Shimamoto, Y. & Toriumi, A., 2002 9月 1, In: Proceedings of the 2nd International Semiconductor Technology Conference (ISTC-2). p. 206-214

  研究成果: Article › 査読

• Long jump in surface self-diffusion : W on W(110)

  S.M.Oh, S. M. O., S.J.Koh, S. J. K., G.Ehrlich, G. E., K.Kyuno, K. K. & Kyuno, K., 2002 4月 1, In: Default journal.

  研究成果: Article › 査読

• New method for Characterizing Dielectric Properties of High-k Films Using Time-Dependent Open-Circuit Potential Measurement

  Kita, K., Sasagawa, M., Kyuno, K. & Toriumi, A., 2002 9月 1, In: Default journal. p. 66-67

  研究成果: Article › 査読

• Non-nearest-neighbor jumps in 2D diffusion: Pd on W(110)

  Oh, S. M., Koh, S. J., Kyuno, K. & Ehrlich, G., 2002 6月 10, In: Physical Review Letters. 88, 23, p. 2361021-2361024 4 p.

  研究成果: Article › 査読

  • atoms 100%
  • activation 78%
  27 被引用数 (Scopus)

• Non-Nearest-Neighbor Jumps in 2D Diffusion: Pd on W(110)

  Oh, S. M., Koh, S. J., Kyuno, K. & Ehrlich, G., 2002 1月 1, In: Physical Review Letters. 88, 23, 1 p.

  研究成果: Article › 査読

  • atoms 100%
  • activation 78%
  5 被引用数 (Scopus)

• Non-nearest-neighbor jumps in 2D diffusion : Pd on W(110)

  S.M.Oh, S. M. O., S.J.Koh, S. J. K., K.Kyuno, K. K., G.Ehrlich, G. E. & Kyuno, K., 2002 4月 1, In: Physical Review Letters. 88

  研究成果: Article › 査読

  27 被引用数 (Scopus)

• Peformance and Time-dependent Degradation in a Single Grain-size Pentacene TFTs

  Komoda, T., Kita, K., K.Kyuno, K. K., Torium, A. & Kyuno, K., 2002 9月 1, In: Extended Abstracts of 2002 International Conference on Solid State Devices and Materials (SSDM). p. 202-203

  研究成果: Article › 査読
• 2003

  A New Characterization Technique for Depth-Dependent Dielectric Properties of High-k Films by Open-Circuit Potential Measurement

  Kita, K., Sasagawa, M., Kyuno, K. & Torium, A., 2003 3月 1, In: 2003 Int. Conference on Characterization and Metrology for ULSI Technology； AIP Conf. Proceedings 550. p. 166-170

  研究成果: Article › 査読

• Anomalous Growth Temperature Dependence of the Surface Roughness of Pentacene Thin Films

  Tejima, M., Kita, K., Kyuno, K. & Toriumi, A., 2003 9月 1, In: Extended Abstracts of 2003 International Conference on Solid State Devices and Materials (SSDM). p. 214-215

  研究成果: Article › 査読

• Electrical Characterization of Metal / Oxide / Pentacene Capacitors

  Toriumi, A., Komoda, T., Kita, K. & Kyuno, K., 2003 3月 1, In: Abstracts of 2nd International Conference on Molecular Electronics and Bioelectronics (M&BE2). p. 117

  研究成果: Article › 査読

• Further EOT Scaling of Ge/HfO2 over Si/HfO2 MOS Systems

  Kita, K., Sasagawa, M., Tomida, K., Toyama, M., Kyuno, K. & Torium, A., 2003 11月 1, In: International Workshop on Gate Insulator (IWGI2003).

  研究成果: Article › 査読

  6 被引用数 (Scopus)

• Interface Oxidation Mechanism in HfO2/Silicon System with Post-Deposition Annealing

  Shimizu, H., Sasagawa, M., Kita, K., Kyuno, K. & Toriumi, A., 2003 9月 1, In: Extended Abstracts of 2003 International Conference on Solid State Devices and Materials (SSDM). p. 486-487

  研究成果: Article › 査読

  3 被引用数 (Scopus)

• Interior barriers and dimer nucleation on islands

  Oh, S. M., Kyuno, K. & Ehrlich, G., 2003 8月 10, In: Surface Science. 540, 1, p. L583-L586

  研究成果: Article › 査読

  • Adatoms 100%
  • Dimers 79%
  • Nucleation 54%
  • adatoms 53%
  • dimers 47%
  1 被引用数 (Scopus)

• New method for characterizing dielectric properties of high-k films with time-dependent open-circuit potential measurement

  Kita, K., Sasagawa, M., Kyuno, K. & Toriumi, A., 2003 6月 15, In: Japanese Journal of Applied Physics, Part 2: Letters. 42, 6 B, p. L631-L633

  研究成果: Article › 査読

  • Dielectric properties 100%
  • dielectric properties 68%
  • Networks (circuits) 45%
  • Etching 44%
  • Atoms 42%

• Oxidation-Induced Damages on Germanium MIS Capacitors with HfO2 Gate Dielectrics

  Kita, K., Sasagawa, M., Tomida, K., Kyuno, K. & Toriumi, A., 2003 9月 1, In: Extended Abstracts of 2003 International Conference on Solid State Devices and Materials (SSDM). p. 292-293

  研究成果: Article › 査読

• Performance and Degradation in Single Grain-Size Pentacene Thin Film Transistors

  T.Komoda, T. K., K.Kita, K. K., K.Kyuno, K. K., A.Toriumi, A. T. & Kyuno, K., 2003 4月 1, In: Japanese Journal of Applied Physics 1. 42

  研究成果: Article › 査読

  32 被引用数 (Scopus)

• Performance and degradation in single grain-size pentacene thin-film transistors

  Komoda, T., Kita, K., Kyuno, K. & Toriumi, A., 2003 6月, In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 42, 6 A, p. 3662-3665 4 p.

  研究成果: Article › 査読

  • Thin film transistors 100%
  • Thin films 73%
  • Moisture 67%
  • moisture 62%
  • transistors 62%
  32 被引用数 (Scopus)

• Re-Examination on the Universality of Si-MOS Inversion Layer Mobility

  Irie, H., Kita, K., Kyuno, K., Takagi, S., Takasaki, K., Kubota, M., Saito, S., Nishikawa, S. & Toriumi, A., 2003 9月 1, In: Extended Abstracts of 2003 International Conference on Solid State Devices and Materials (SSDM). p. 716-717

  研究成果: Article › 査読

• Step-edge versus interior barriers to atom incorporation at lattice steps

  Oh, S. M., Kyuno, K., Wang, S. C. & Ehrlich, G., 2003 2月 26, In: Physical Review B - Condensed Matter and Materials Physics. 67, 7

  研究成果: Article › 査読

  • Atoms 100%
  • Energy barriers 98%
  • Energy Barrier 92%
  • Molecular Cluster 62%
  • Adatoms 61%
  8 被引用数 (Scopus)
• 2004

  Accumulated Carrier Density Dependence of Pentacene TFT Mobility Determined by Split C-V Technique

  Yokoyama, T., Nishimura, T., Kita, K., Kyuno, K. & Toriumi, A., 2004 9月 1, In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). p. 856-857

  研究成果: Article › 査読

• Advantages of Ge (111) Surface for High Quality HfO2/Ge Interface

  Toyama, M., Kita, K., Kyuno, K. & Toriumi, A., 2004 9月 1, In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). p. 226-227

  研究成果: Article › 査読

• Complex Impedance Analysis and Photo-Induced Effects of Semiconducting Pentacene Films

  Nishimura, T., Yokoyama, T., Kita, K., Kyuno, K. & Toriumi, A., 2004 9月 1, In: Extended Abstracts of 2004 International Conference on Solid State Devices and Materials (SSDM). p. 866-867

  研究成果: Article › 査読