40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

Masahiro Sasaki; Takuro Inoue; Makoto Ikeda; Kunihiro Asada

doi:10.1109/ASSCC.2007.4425781

40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

Masahiro Sasaki, Takuro Inoue, Makoto Ikeda, Kunihiro Asada

研究成果: Conference contribution

抄録

This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

本文言語	English
ホスト出版物のタイトル	2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
ページ	264-267
ページ数	4
DOI	https://doi.org/10.1109/ASSCC.2007.4425781
出版ステータス	Published - 2007
外部発表	はい
イベント	2007 IEEE Asian Solid-State Circuits Conference, A-SSCC - Jeju, Korea, Republic of 継続期間: 2007 11月 12 → 2007 11月 14

出版物シリーズ

名前	2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

Conference

Conference	2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
国/地域	Korea, Republic of
City	Jeju
Period	07/11/12 → 07/11/14

ASJC Scopus subject areas

ハードウェアとアーキテクチャ
電子工学および電気工学

文献へのアクセス

10.1109/ASSCC.2007.4425781

他のファイルとリンク

引用スタイル

Sasaki, M, Inoue, T, Ikeda, M & Asada, K 2007, 40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip. in 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC., 4425781, 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC, pp. 264-267, 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC, Jeju, Korea, Republic of, 07/11/12. https://doi.org/10.1109/ASSCC.2007.4425781

@inproceedings{8fb0d73db0d74976b65b3e3010ad543c,

title = "40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip",

abstract = "This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.",

author = "Masahiro Sasaki and Takuro Inoue and Makoto Ikeda and Kunihiro Asada",

year = "2007",

doi = "10.1109/ASSCC.2007.4425781",

language = "English",

isbn = "1424413605",

series = "2007 IEEE Asian Solid-State Circuits Conference, A-SSCC",

pages = "264--267",

booktitle = "2007 IEEE Asian Solid-State Circuits Conference, A-SSCC",

note = "2007 IEEE Asian Solid-State Circuits Conference, A-SSCC ; Conference date: 12-11-2007 Through 14-11-2007",

}

TY - GEN

T1 - 40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

AU - Sasaki, Masahiro

AU - Inoue, Takuro

AU - Ikeda, Makoto

AU - Asada, Kunihiro

PY - 2007

Y1 - 2007

N2 - This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

AB - This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

UR - http://www.scopus.com/inward/record.url?scp=51349140973&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=51349140973&partnerID=8YFLogxK

U2 - 10.1109/ASSCC.2007.4425781

DO - 10.1109/ASSCC.2007.4425781

M3 - Conference contribution

AN - SCOPUS:51349140973

SN - 1424413605

SN - 9781424413607

T3 - 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

SP - 264

EP - 267

BT - 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

T2 - 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

Y2 - 12 November 2007 through 14 November 2007

ER -

40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

抄録

出版物シリーズ

Conference

ASJC Scopus subject areas

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