A compact HBT device model based on a one-flux treatment of carrier transport

Shin ichi Tanaka, M. S. Lundstrom

研究成果: Article査読

29 被引用数 (Scopus)

抄録

A new approach to modeling the current vs voltage characteristics of heterojunction bipolar transistors (HBTs) is introduced. Using McKelvey's flux method to treat carrier transport, provides a strong, physical basis for modeling the complex device physics in modern HBTs. We formulate the new model for general, double heterojunction bipolar transistors and show that the results reduce to those obtained by the conventional current balancing approach only under specific, simplifying conditions. We also extend the model to treat quasi-ballistic transport in short base HBTs.

本文言語English
ページ(範囲)401-410
ページ数10
ジャーナルSolid State Electronics
37
3
DOI
出版ステータスPublished - 1994 3月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学
  • 材料化学

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