A test chip for evaluating switching noise and radiated emission by I/O and core circuits

Engineering & Materials Science

• Buffer circuits 100%
• Logic circuits 70%
• Printed circuit boards 61%
• Networks (circuits) 33%
• Electric wiring 33%
• Packaging 27%
• Radiation 24%
• Silicon 24%

Physics & Astronomy

• chips 48%
• logic circuits 27%
• large scale integration 25%
• printed circuits 25%
• circuit boards 24%
• buffers 17%
• electromagnetic noise 13%
• wiring 13%
• packaging 10%
• CMOS 9%
• near fields 8%
• evaluation 6%
• silicon 5%