A Visual Odometry for Wide Angle Fovea Sensor SLAM

Tomoki Takamura, Sota Shimizu, Rei Murakami, Alessandro Carfi, Fulvio Mastrogiovanni

研究成果: Conference contribution

抄録

This paper presents a method of wide angle fovea visual odometry (WAF-VO) for Wide Angle Fovea Sensor SLAM (WAF-SLAM), by which a unique locally-high accurate and wide-angle map is generated in addition to camera motion estimation. The WAF sensor is a special-made wide-angle sensor that is inspired from human visual function, i.e., the spatial resolution of the image is not uniform throughout the entire field of view (FOV); it is much higher in the central FOV and decreases rapidly towards the periphery. Our visual odometry method is strongly characterized by a wide-angle FOV and space-variant resolution of the input image from the WAF sensor. A locally-high accurate and wide-angle mapping method is proposed as a major part for WAF-SLAM together with the camera motion estimation. Our proposed method estimates camera motions more stably using very low-spatial-resolution wide-angle images remapped from the input image of the WAF sensor. Using the estimated camera motions, narrow-angle high accurate maps are generated from corresponding feature points in high-spatial resolution central regions of the input image. Wide-angle maps are generated from ones in middle-spatial-resolution wide-angle images remapped from the input image apart from the above very low-spatial-resolution images. When the wide-angle maps are generated, the number of extracted feature points is increased by adjusting contrast threshold values of SIFT feature according to regions of the FOV. A KNN matching method improved using epipolar constraint is proposed and employed for avoidance of mismatching the increased feature points. Thus, the wide-angle maps are generated from more correct corresponding feature points. Finally, the above two types of maps are combined into the unique locally-high accurate and wide-angle map, i.e., a WAF map. Using our proposed method, the WAF map was generated by verification experiments. Furthermore, the paper presents an evaluation of the accuracy and precision of the generated map.

本文言語English
ホスト出版物のタイトルIECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society
出版社IEEE Computer Society
ISBN(電子版)9781665435543
DOI
出版ステータスPublished - 2021 10月 13
イベント47th Annual Conference of the IEEE Industrial Electronics Society, IECON 2021 - Toronto, Canada
継続期間: 2021 10月 132021 10月 16

出版物シリーズ

名前IECON Proceedings (Industrial Electronics Conference)
2021-October

Conference

Conference47th Annual Conference of the IEEE Industrial Electronics Society, IECON 2021
国/地域Canada
CityToronto
Period21/10/1321/10/16

ASJC Scopus subject areas

  • 制御およびシステム工学
  • 電子工学および電気工学

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