TY - GEN
T1 - An approach for measurements of optical constants for molten Sb2Te3 by spectroscopic ellipsometer
AU - Kuwahara, Masashi
AU - Fukaya, Toshio
AU - Endo, Rie
AU - Susa, Masahiro
AU - Tsutsumi, Kouichi
AU - Suzuki, Michio
AU - Morikasa, Fukuyoshi
AU - Endo, Tomoyoshi
AU - Tadokoro, Toshiyasu
PY - 2011
Y1 - 2011
N2 - We have succeeded in measuring optical constants of molten Sb2Te3 wavelength range from 350 to 1000 nm using a novel system consisting of a spectroscopic ellipsometer and an infrared heating system.
AB - We have succeeded in measuring optical constants of molten Sb2Te3 wavelength range from 350 to 1000 nm using a novel system consisting of a spectroscopic ellipsometer and an infrared heating system.
UR - http://www.scopus.com/inward/record.url?scp=85088759912&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85088759912&partnerID=8YFLogxK
U2 - 10.1364/isom_ods.2011.ome3
DO - 10.1364/isom_ods.2011.ome3
M3 - Conference contribution
AN - SCOPUS:85088759912
SN - 9781557529152
T3 - Optics InfoBase Conference Papers
BT - Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
PB - Optical Society of America (OSA)
T2 - Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
Y2 - 17 July 2011 through 20 July 2011
ER -