An electron backscatter diffraction investigation of crystallographic orientations of embedded nanoparticles within melt-textured YBCO high temperature superconductors

A. Koblischka-Veneva, M. R. Koblischka, N. Hari Babu, D. A. Cardwell, L. Shlyk, G. Krabbes

研究成果: Article査読

17 被引用数 (Scopus)

抄録

Microstructures of melt-textured YBCO samples with embedded nanosized particles of Y2BaCuO5 (Y-211) and Y2Ba 4CuMOx (M-2411 with M ≤ U,Zr) are analysed by means of electron backscatter diffraction (EBSD). With the recent developments of the EBSD technique, we can directly measure the crystallographic orientation of the embedded nanoparticles, employing a spatial resolution of about 40 nm. The high image quality of the Kikuchi patterns allows true three-phase (YBCO, Y-211 and M-2411) scans to be performed. The Y-211 particles do not exhibit any preferred orientation, even if their size is considerably reduced, to the 100 nm range. The size reduction reduces the negative influence of the Y-211 particles on the YBCO matrix, however. U-2411 particles, which are formed during the processing stage, do not show any orientation, and with increasing concentration, some texture develops. In contrast to this, embedded Zr-2411 particles are fully oriented in the (001) orientation according to the surrounding superconducting matrix.

本文言語English
ページ(範囲)S562-S566
ジャーナルSuperconductor Science and Technology
19
7
DOI
出版ステータスPublished - 2006 7月 1
外部発表はい

ASJC Scopus subject areas

  • セラミックおよび複合材料
  • 凝縮系物理学
  • 金属および合金
  • 電子工学および電気工学
  • 材料化学

フィンガープリント

「An electron backscatter diffraction investigation of crystallographic orientations of embedded nanoparticles within melt-textured YBCO high temperature superconductors」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル