Analysis of field-plate effects on buffer-related lag phenomena and current collapse in GaN MESFETs and AlGaN/GaN HEMTs

Physics & Astronomy

• high electron mobility transistors 89%
• time lag 73%
• buffers 72%
• field effect transistors 67%
• passivity 13%
• trapping 11%
• injection 10%
• curves 7%
• electric potential 7%
• electrons 6%

Engineering & Materials Science

• High electron mobility transistors 100%
• Buffer layers 82%
• Electron injection 45%
• Passivation 34%
• Field effect transistors 30%
• Transient analysis 27%
• Electric potential 14%

Chemical Compounds

• Plate Like Crystal 68%
• Deep Donor 52%
• Buffer Solution 37%
• Chemical Passivation 29%
• Length 17%
• Electron Particle 15%