TY - GEN
T1 - Anti-resonance peak frequency control by variable on-die capacitance
AU - Ichimura, Wataru
AU - Kiyoshige, Sho
AU - Terasaki, Masahiro
AU - Kobayashi, Ryota
AU - Kubo, Genki
AU - Otsuka, Hiroki
AU - Sudo, Toshio
PY - 2013/1/1
Y1 - 2013/1/1
N2 - Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.
AB - Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.
KW - Anti-resonance peaks
KW - Co-design
KW - Power integrity
KW - Power supply noises
UR - http://www.scopus.com/inward/record.url?scp=84897741904&partnerID=8YFLogxK
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U2 - 10.1109/EMCCompo.2013.6735195
DO - 10.1109/EMCCompo.2013.6735195
M3 - Conference contribution
AN - SCOPUS:84897741904
SN - 9781479923151
T3 - EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
SP - 171
EP - 174
BT - EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
PB - IEEE Computer Society
T2 - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
Y2 - 15 December 2013 through 18 December 2013
ER -