@article{dc92080f39c34367a31cbce142cb4a68,
title = "Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope",
abstract = "Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored.",
keywords = "Aberration-correction, Confocal, SCEM, Three dimensional",
author = "Peng Wang and Gavin Behan and Kirkland, {Angus I.} and Nellist, {Peter D.} and Cosgriff, {Eireann C.} and D'Alfonso, {Adrian J.} and Morgan, {Andrew J.} and Allen, {Leslie J.} and Ayako Hashimoto and Masaki Takeguchi and Kazutaka Mitsuishi and Masayuki Shimojo",
note = "Funding Information: P. Wang, A.I. Kirkland and P.D. Nellist would like to acknowledge financial support from the Leverhulme Trust ( F/08 749/B ) and the EPSRC ( EP/F048009/1 ). G. Behan would like to thank Intel Ireland Ltd for financial support. Technical assistance from JEOL Ltd and JEOL (UK) Ltd is also acknowledged. L.J. Allen acknowledges support from the Australian Research Council. A part of this work was supported by the Japan Society for the Promotion of Science , Japan–UK Research Cooperative Program. K. Mitsuishi would like to acknowledge the financial support by a Grant-in-Aid for Scientific Research (C) 2009-218577 . A. Hashimoto would like to acknowledge the financial support by a Grant-in-Aid for Young Scientists (B) 20760027 . The authors would like to thank Dr. N.P. Young for assistance with the Oxford JEOL 2200 microscope.",
year = "2011",
month = jun,
doi = "10.1016/j.ultramic.2010.10.012",
language = "English",
volume = "111",
pages = "877--886",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "7",
}