抄録
This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.
| 本文言語 | English |
|---|---|
| ページ | 73-76 |
| ページ数 | 4 |
| 出版ステータス | Published - 2001 12月 1 |
| イベント | IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States 継続期間: 2001 10月 29 → 2001 10月 31 |
Conference
| Conference | IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging |
|---|---|
| 国/地域 | United States |
| City | Cambridge, MA |
| Period | 01/10/29 → 01/10/31 |
ASJC Scopus subject areas
- 工学（全般）