Characterization of refractive index changes of silica glass induced by ion microbeam

M. Hattori, Y. Ohki, M. Fujimaki, T. Souno, H. Nishikawa, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

研究成果: Conference article査読

7 被引用数 (Scopus)


Distributions of structural and refractive index changes of silica irradiated by H+ microbeam were studied by optical and atomic force microscopes (AFM). The AFM measurements on the microbeam irradiated area show the formation of a groove on the surface. In addition, a cross sectional observation on the surface parallel to the incident plane reveals surface deformation along the ion tracks, which is deepest at the projected range of ions. Taking into account the possible structural changes of silica induced by energy deposition calculated by TRIM, the measured topological changes at the front and side surfaces result from internal compaction of silica glass. Refractive index changes were estimated from the Lorentz-Lorenz relationship using the distribution of the internal compaction estimated by the AFM measurements.

ジャーナルNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
出版ステータスPublished - 2003 9月
イベント8th International Conference on Nuclear Microprobe Technology - Takasaki, Japan
継続期間: 2002 9月 82002 9月 13

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学


「Characterization of refractive index changes of silica glass induced by ion microbeam」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。