Design and Analysis of On-chip Leakage Monitor using an MTCMOS circuit

S. Koyama, S. Takeda, K. Usami

研究成果: Article › 査読

本文言語	English
ページ（範囲）	205-208
ジャーナル	The 23rd International Technical Conference on Circuits/Systems; Computers and Communications (ITC-CSCC'08)
出版ステータス	Published - 2008 7月 8

引用スタイル

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title = "Design and Analysis of On-chip Leakage Monitor using an MTCMOS circuit",

author = "S. Koyama and S. Takeda and K. Usami",

year = "2008",

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language = "English",

pages = "205--208",

journal = "The 23rd International Technical Conference on Circuits/Systems; Computers and Communications (ITC-CSCC'08)",

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T1 - Design and Analysis of On-chip Leakage Monitor using an MTCMOS circuit

AU - Koyama, S.

AU - Takeda, S.

AU - Usami, K.

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M3 - Article

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EP - 208

JO - The 23rd International Technical Conference on Circuits/Systems; Computers and Communications (ITC-CSCC'08)

JF - The 23rd International Technical Conference on Circuits/Systems; Computers and Communications (ITC-CSCC'08)

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