抄録
We analyze AlGaN/GaN HEMTs with a buffer layer where a deep acceptor above the midgap is considered, and studied how the off-state breakdown voltage is influenced by introducing a high-k passivation layer. As a result, it is shown that the breakdown voltage improves as in a case with a deep donor whose energy level is set equal to the acceptor's energy level, and in this case the breakdown voltage becomes a little higher in the region where the relative permittivity of the passivation layer is high. It is also shown that when the deep-acceptor's energy level is deeper, the breakdown voltage becomes higher in the highk region because the buffer leakage current becomes smaller.
本文言語 | English |
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ホスト出版物のタイトル | Informatics, Electronics and Microsystems - TechConnect Briefs 2017 |
出版社 | TechConnect |
ページ | 31-34 |
ページ数 | 4 |
巻 | 4 |
ISBN(電子版) | 9780998878218 |
出版ステータス | Published - 2017 |
イベント | 11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo, and the 2017 National SBIR/STTR Conference - Washington, United States 継続期間: 2017 5月 14 → 2017 5月 17 |
Other
Other | 11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo, and the 2017 National SBIR/STTR Conference |
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国/地域 | United States |
City | Washington |
Period | 17/5/14 → 17/5/17 |
ASJC Scopus subject areas
- 燃料技術
- 表面、皮膜および薄膜
- バイオテクノロジー
- 流体および伝熱