Electronic properties of femtosecond laser induced modified spots on single crystal silicon carbide

T. Tomita, M. Iwami, M. Yamamoto, M. Deki, S. Matsuo, S. Hashimoto, Y. Nakagawa, T. Kitada, T. Isu, S. Saito, K. Sakai, S. Onoda, T. Ohshima

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

Femtosecond (fs) laser modification on single crystal silicon carbide (SiC) was studied from the viewpoints of electric conductivity. Fourier transform infrared (FTIR) spectroscopy was carried out on femtosecond laser modified area. The intensity decrease of reststrahlen band due to the modification was observed, and this decrease was explained by the degradation of crystallinity due to the laser irradiation. Polarization dependence of reststrahlen band was also observed on laser modified samples. Current-voltagecharacteristics and Hall measurements on fs-laser modified region were carried out by fabricating the metal contacts on the ion implanted areas. The specific resistance up to 5.9×10-2 Ωm was obtained for fs-laser modified area.

本文言語English
ホスト出版物のタイトルSilicon Carbide and Related Materials 2009
ホスト出版物のサブタイトルICSCRM 2009
出版社Trans Tech Publications Ltd
ページ239-242
ページ数4
ISBN(印刷版)0878492798, 9780878492794
DOI
出版ステータスPublished - 2010 1月 1
外部発表はい
イベント13th International Conference on Silicon Carbide and Related Materials 2009, ICSCRM 2009 - Nurnberg, Germany
継続期間: 2009 10月 112009 10月 16

出版物シリーズ

名前Materials Science Forum
645-648
ISSN(印刷版)0255-5476

Conference

Conference13th International Conference on Silicon Carbide and Related Materials 2009, ICSCRM 2009
国/地域Germany
CityNurnberg
Period09/10/1109/10/16

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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