EMI peak frequency forecast by power supply transfer impedance with on-chip property

Yusuke Hatogai, Hayato Sasaki, Toshio Sudo

研究成果: Conference contribution

抄録

Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.

本文言語English
ホスト出版物のタイトルEMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
DOI
出版ステータスPublished - 2012 12月 1
イベントInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 - Rome, Italy
継続期間: 2012 9月 172012 9月 21

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012
国/地域Italy
CityRome
Period12/9/1712/9/21

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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