Energy filtered scanning confocal electron microscopy (EF-SCEM)

P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, A. I. Kirkl, P. D. Nellist

研究成果: Article › 査読

引用スタイル

@article{1328733dcaf842f5bec9ae727db68b7a,

title = "Energy filtered scanning confocal electron microscopy (EF-SCEM)",

author = "P. Wang and G. Behan and A. Hashimoto and M. Takeguchi and K. Mitsuishi and M. Shimojo and Kirkl, {A. I.} and Nellist, {P. D.}",

year = "2010",

month = sep,

day = "1",

language = "English",

journal = "Default journal",

}