TY - JOUR
T1 - Humidity reliability of commercial flash memories for long-term storage
AU - Murota, Tomoki
AU - Mimura, Toshiki
AU - Gomasang, Ploybussara
AU - Yokogawa, Shinji
AU - Ueno, Kazuyoshi
N1 - Publisher Copyright:
© 2020 The Japan Society of Applied Physics.
PY - 2020/7/1
Y1 - 2020/7/1
N2 - To investigate the feasibility of flash memory reliability in an environment for the application of long-term data storage, temperature and humidity acceleration tests have been carried out for commercial flash memories. Nine commercial 16GB SD cards with conventional package were kept in a test chamber of 85 °C/85%RH for up to 3040 h and we checked the write/read operation using free software "Check Flash" after the storage test. The lifetime against humidity is predicted by the power law humidity model (Peck model), which is widely used for the lifetime prediction, assuming the average parameters such as humidity acceleration factor (n) and activation energy ($E) from the literatures. Although further studies to assure the reliability, the results indicate that commercial flash memories preliminary have the feasibility of a long-term storage media over 100 years.
AB - To investigate the feasibility of flash memory reliability in an environment for the application of long-term data storage, temperature and humidity acceleration tests have been carried out for commercial flash memories. Nine commercial 16GB SD cards with conventional package were kept in a test chamber of 85 °C/85%RH for up to 3040 h and we checked the write/read operation using free software "Check Flash" after the storage test. The lifetime against humidity is predicted by the power law humidity model (Peck model), which is widely used for the lifetime prediction, assuming the average parameters such as humidity acceleration factor (n) and activation energy ($E) from the literatures. Although further studies to assure the reliability, the results indicate that commercial flash memories preliminary have the feasibility of a long-term storage media over 100 years.
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U2 - 10.35848/1347-4065/ab85dc
DO - 10.35848/1347-4065/ab85dc
M3 - Article
AN - SCOPUS:85084661523
SN - 0021-4922
VL - 59
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - SL
M1 - SLLC01
ER -