Impact of fault resistance on impedance relay: Adaptive Mho directional type scheme development using LabVIEW

David Majambere, Goro Fujita

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Normally, fault resistances come out with errors in the fault calculation algorithm on conventional Mho distance protection scheme which might force the relay to under-reach/over-reach based on the network conditions. With a constrained shape, Mho Directional distance elements can provide more resistive coverage while discriminating between forward and reverse faults. In this work, the recurring effect a fault resistance can have on a Mho Distance protection scheme relay is assessed and analyzed for single line-to-ground(SLG) faults for both protective schemes. Finally, an adaptive correction algorithm is applied to compensate errors introduced in the fault calculation unit using local end data. The design and simulation are performed using LabVIEW and MATLAB/SIMULINK. Magnitudes and angles of three voltages and currents are obtained through Discrete Fourier Transform(DFT). Different scenarios are carried out and validate the effectiveness of the scheme. Moreover, an improved Graphical User Interface(GUI) is developed for easy and convenient interaction between users and the relay model.

本文言語English
ホスト出版物のタイトルTENCON 2017 - 2017 IEEE Region 10 Conference
出版社Institute of Electrical and Electronics Engineers Inc.
ページ3006-3011
ページ数6
ISBN(電子版)9781509011339
DOI
出版ステータスPublished - 2017 12月 19
イベント2017 IEEE Region 10 Conference, TENCON 2017 - Penang, Malaysia
継続期間: 2017 11月 52017 11月 8

出版物シリーズ

名前IEEE Region 10 Annual International Conference, Proceedings/TENCON
2017-December
ISSN(印刷版)2159-3442
ISSN(電子版)2159-3450

Other

Other2017 IEEE Region 10 Conference, TENCON 2017
国/地域Malaysia
CityPenang
Period17/11/517/11/8

ASJC Scopus subject areas

  • コンピュータ サイエンスの応用
  • 電子工学および電気工学

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