Influence of analysis parameters on the microstructural characterization of nanoscale precipitates

Ai Serizawa, M. K. Miller

研究成果: Conference contribution

5 被引用数 (Scopus)

抄録

A series of simulated microstructures containing nanometer-scale precipitates was created with an atom probe data simulator. These data were then analyzed with the proximity histogram by creating isoconcentration surfaces to determine the influence of the analysis method. For simulated 2-nm-radius spherical precipitates, the optimized voxel size and delocalization were found to be 0.5-0.6 nm and 1.0-1.5 nm, respectively. Under optimum analysis parameters, the voxelization/delocalization process only slightly degrades the interface width determined from the proximity histogram to ∼0.15±0.04 nm.

本文言語English
ホスト出版物のタイトルAdvanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution
ページ19-25
ページ数7
出版ステータスPublished - 2010
外部発表はい
イベント2009 MRS Fall Meeting - Boston, MA, United States
継続期間: 2009 11月 302009 12月 4

出版物シリーズ

名前Materials Research Society Symposium Proceedings
1231
ISSN(印刷版)0272-9172

Conference

Conference2009 MRS Fall Meeting
国/地域United States
CityBoston, MA
Period09/11/3009/12/4

ASJC Scopus subject areas

  • 材料科学一般
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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