TY - GEN
T1 - Investigation of dominant factors to control c-axis tilt angle of aln thin films for efficient energy harvesting
AU - Wang, Qi
AU - Oguchi, Hiroyuki
AU - Hara, Motoaki
AU - Kuwano, Hiroki
PY - 2014
Y1 - 2014
N2 - We investigated the experimental conditions affecting degree of c-axis tilt angle, which is related to output power of piezoelectric energy harvesters, of the oriented aluminum nitride (AlN) thin films grown using electron cyclotron resonance (ECR) sputtering. The c-axis tilt angle of the AlN thin films deposited on silicon (100) substrates was measured by X-ray diffractometry with a 2-dimenaioanl detector (2D XRD). This study verified that 1) lowering the incident angle of the flux during thin film growth and 2) lower substrate temperature, and 3) increasing the buffer layer roughness are effective ways to increase the c-axis tilt angle of the AlN thin films.
AB - We investigated the experimental conditions affecting degree of c-axis tilt angle, which is related to output power of piezoelectric energy harvesters, of the oriented aluminum nitride (AlN) thin films grown using electron cyclotron resonance (ECR) sputtering. The c-axis tilt angle of the AlN thin films deposited on silicon (100) substrates was measured by X-ray diffractometry with a 2-dimenaioanl detector (2D XRD). This study verified that 1) lowering the incident angle of the flux during thin film growth and 2) lower substrate temperature, and 3) increasing the buffer layer roughness are effective ways to increase the c-axis tilt angle of the AlN thin films.
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U2 - 10.1109/MEMSYS.2014.6765721
DO - 10.1109/MEMSYS.2014.6765721
M3 - Conference contribution
AN - SCOPUS:84898980484
SN - 9781479935086
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 636
EP - 639
BT - MEMS 2014 - 27th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 27th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2014
Y2 - 26 January 2014 through 30 January 2014
ER -