Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami; E.Yamazaki E.Yamazaki; K.Nakano K.Nakano; T.Sudo T.Sudo; S.Haga S.Haga; S.Hoshino S.Hoshino; S.Wakana S.Wakana; M.Kishi M.Kishi; M.Tsuchiya M.Tsuchiya; Toshio Sudo

Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami, E.Yamazaki E.Yamazaki, K.Nakano K.Nakano, T.Sudo T.Sudo, S.Haga S.Haga, S.Hoshino S.Hoshino, S.Wakana S.Wakana, M.Kishi M.Kishi, M.Tsuchiya M.Tsuchiya, Toshio Sudo

機能制御システム専攻

研究成果: Article › 査読

本文言語	English
ページ（範囲）	155-160
ジャーナル	ICEMC 2002
出版ステータス	Published - 2002 10月 15

引用スタイル

@article{d5bb1e3642774f99bbb5a4050e259716,

title = "Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,",

author = "M.Iwanami M.Iwanami and E.Yamazaki E.Yamazaki and K.Nakano K.Nakano and T.Sudo T.Sudo and S.Haga S.Haga and S.Hoshino S.Hoshino and S.Wakana S.Wakana and M.Kishi M.Kishi and M.Tsuchiya M.Tsuchiya and Toshio Sudo",

year = "2002",

month = oct,

day = "15",

language = "English",

pages = "155--160",

journal = "ICEMC 2002",

}

TY - JOUR

T1 - Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

AU - M.Iwanami, M.Iwanami

AU - E.Yamazaki, E.Yamazaki

AU - K.Nakano, K.Nakano

AU - T.Sudo, T.Sudo

AU - S.Haga, S.Haga

AU - S.Hoshino, S.Hoshino

AU - S.Wakana, S.Wakana

AU - M.Kishi, M.Kishi

AU - M.Tsuchiya, M.Tsuchiya

AU - Sudo, Toshio

PY - 2002/10/15

Y1 - 2002/10/15

M3 - Article

SP - 155

EP - 160

JO - ICEMC 2002

JF - ICEMC 2002

ER -