Measurement and analysis of SSN and Jitter of FPGA

Haruya Fujita, Yo Iijima, Toshio Sudo

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

Parasitic inductance that exists in a package induces SSN (Simultaneous Switching Noise) and timing jitter. These noises cause malfunction of LSI and systems. The goal of this paper is to clarify the influence of the effective inductance of the package including mutual inductance by changing the number of simultaneously switching buffers and alternating adjacent buffers in the reverse direction each other. In this study, measured SSNs were reproduced by HSPICE simulation. The whole simulation model consisted of on-chip PDN (Power Distribution Network), package PDN and board PDN, along with I/O buffer model. The simulated SSN waveforms agreed well with the measured results.

本文言語English
ホスト出版物のタイトルEMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
DOI
出版ステータスPublished - 2012
イベントInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 - Rome, Italy
継続期間: 2012 9月 172012 9月 21

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012
国/地域Italy
CityRome
Period12/9/1712/9/21

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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