TY - GEN
T1 - Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness
AU - Dobashi, Yoshinori
AU - Ijiri, Takashi
AU - Todo, Hideki
AU - Iwasaki, Kei
AU - Okabe, Makoto
AU - Nishimura, Satoshi
N1 - Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2016/7/24
Y1 - 2016/7/24
N2 - Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.
AB - Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.
KW - BRDF
KW - Laser microscopy
KW - Microstructures
UR - http://www.scopus.com/inward/record.url?scp=84986000707&partnerID=8YFLogxK
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U2 - 10.1145/2945078.2945106
DO - 10.1145/2945078.2945106
M3 - Conference contribution
AN - SCOPUS:84986000707
T3 - SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
BT - SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
PB - Association for Computing Machinery, Inc
T2 - ACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016
Y2 - 24 July 2016 through 28 July 2016
ER -