Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope

Peng Wang, Gavin Behan, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Masayuki Shimojo, Angus I. Kirkland, Peter D. Nellist

研究成果: Article › 査読