TY - JOUR
T1 - Ni electroplating on a resist micro-machined by proton beam writing
AU - Uchiya, Naoyuki
AU - Furuta, Yusuke
AU - Nishikawa, Hiroyuki
AU - Watanabe, Tohru
AU - Haga, Junji
AU - Satoh, Takahiro
AU - Oikawa, Masakazu
AU - Ishii, Yasuyuki
AU - Kamiya, Tomihiro
N1 - Funding Information:
This work was performed under the JAEA-Cooperation Research Program at TIARA and is partly supported by a Grant-in-Aid for Scientific Research from the Japan Society for the Promotion of Science (No. 17310085) and by “Academic Frontier” Project of the Ministry of Education, Culture, Sports, Science and Technology, Japan.
PY - 2008/10
Y1 - 2008/10
N2 - In this paper we report fabrication of high-aspect-ratio micro-structure of Ni by electroplating, using a micro-machining technique of resists using proton beam writing (PBW) at Japan Atomic Energy Agency (JAEA). A micro-structure of 5 μm thick PMMA was fabricated by exposure using PBW at 1.7 MeV and by development. A Ni structure was then formed by electroplating on the micro-structure of PMMA. Vertical and smooth side walls observed by a scanning electron microscope (SEM) indicate that PBW can be a versatile tool for fabrication of resists and metal microstructure in combination with electroplating. The electroplated Ni structure can be used as a resolution standard, which enabled us to focus the proton beam down to 130 nm.
AB - In this paper we report fabrication of high-aspect-ratio micro-structure of Ni by electroplating, using a micro-machining technique of resists using proton beam writing (PBW) at Japan Atomic Energy Agency (JAEA). A micro-structure of 5 μm thick PMMA was fabricated by exposure using PBW at 1.7 MeV and by development. A Ni structure was then formed by electroplating on the micro-structure of PMMA. Vertical and smooth side walls observed by a scanning electron microscope (SEM) indicate that PBW can be a versatile tool for fabrication of resists and metal microstructure in combination with electroplating. The electroplated Ni structure can be used as a resolution standard, which enabled us to focus the proton beam down to 130 nm.
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U2 - 10.1007/s00542-007-0549-0
DO - 10.1007/s00542-007-0549-0
M3 - Article
AN - SCOPUS:49949104383
SN - 0946-7076
VL - 14
SP - 1537
EP - 1540
JO - Microsystem Technologies
JF - Microsystem Technologies
IS - 9-11
ER -