TY - GEN
T1 - Physics-based simulation of field-plate effects on substrate- and surface-related current slump in GaAs FETs
AU - Tanaka, T.
AU - Itagaki, K.
AU - Nakajima, A.
AU - Horio, K.
PY - 2009
Y1 - 2009
N2 - Two-dimensional transient simulation of GaAs FETs with a field plate is performed in which substrate traps and surface states are considered. Quasi-pulsed I-V curves are derived from the transient characteristics. It is studied how the existence of field plate affects slow current transients and current slump due to substrate traps and surface states. It is shown that both the substrate-related and surface state-related transients and current slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness under the field plate to reduce the current slump and also to maintain high frequency performance of GaAs FETs.
AB - Two-dimensional transient simulation of GaAs FETs with a field plate is performed in which substrate traps and surface states are considered. Quasi-pulsed I-V curves are derived from the transient characteristics. It is studied how the existence of field plate affects slow current transients and current slump due to substrate traps and surface states. It is shown that both the substrate-related and surface state-related transients and current slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness under the field plate to reduce the current slump and also to maintain high frequency performance of GaAs FETs.
UR - http://www.scopus.com/inward/record.url?scp=72449192156&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=72449192156&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:72449192156
SN - 9782874870125
T3 - European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009
SP - 164
EP - 167
BT - European Microwave Week 2009, EuMW 2009
T2 - European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009
Y2 - 28 September 2009 through 2 October 2009
ER -