Preparation and Properties of Anti-Reflection/Anti-Static Thin Films for Cathode Ray Tubes Prepared by Sol-Gel Method Using Photoirradiation

T. Ohishi; S. Maekawa; T. Ishikawa; D. Kamoto

doi:10.1007/BF02436891

Preparation and Properties of Anti-Reflection/Anti-Static Thin Films for Cathode Ray Tubes Prepared by Sol-Gel Method Using Photoirradiation

T. Ohishi, S. Maekawa, T. Ishikawa, D. Kamoto

研究成果: Article › 査読

16 被引用数 (Scopus)

抄録

A new technique for preparing anti-reflection/anti-static thin films for CRTs at low temperature has been developed. Double-layered films of SiO₂/SnO₂ were formed on a CRT panel surface by the sol-gel method using photoirradiation. The new method makes it possible to reduce heat treatment temperature (°C) by almost 50% and treatment time to approximately 33% of the conventional levels.

本文言語	English
ページ（範囲）	511-515
ページ数	5
ジャーナル	Journal of Sol-Gel Science and Technology
巻	8
号	1-3
DOI	https://doi.org/10.1007/BF02436891
出版ステータス	Published - 1997 1月 1
外部発表	はい

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
セラミックおよび複合材料
化学 (全般)
生体材料
凝縮系物理学
材料化学

文献へのアクセス

10.1007/BF02436891

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引用スタイル

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