A new technique for preparing anti-reflection/anti-static thin films for CRTs at low temperature has been developed. Double-layered films of SiO2/SnO2 were formed on a CRT panel surface by the sol-gel method using photoirradiation. The new method makes it possible to reduce heat treatment temperature (°C) by almost 50% and treatment time to approximately 33% of the conventional levels.
|ジャーナル||Journal of Sol-Gel Science and Technology|
|出版ステータス||Published - 1997 1月 1|
ASJC Scopus subject areas
- 化学 (全般)