Quenching characteristics of YBCO bulk contacts

Koichiro Sawa, Katsuya Fukuda, Kuniyasu Ogawa, Masaru Tomita, Masato Murakami, Naomichi Sakai, Izumi Hirabayashi

研究成果: Conference contribution

抄録

A persistent current switch (PCS) is used for superconducting applications, such as superconducting magnetic energy storage (SMES) system. The authors have proposed a mechanical switch of Y-Ba-Cu-O (YBCO) bulk as a mechanical PCS. In previous study, in order to investigate the contact characteristics of the switch, 50A current tests were performed and the contact resistance between two YBCO contacts was measured by four terminal method. As a result, it became clear that polishing and metal depositing on contact surfaces was effective to reduce the residual resistance, and the authors achieved to reduce this resistance to 0.27ìÙ, which was less than our target value of 1ìÙ. This paper focused on the transfer from superconductive to normal conductive state in the YBCO contacts (quenching characteristics), which was not obtained by former 50A current test. In order to perform this experiment, 150A DC power supply and two kinds of curvature silver contacts (R15 and R7.5) as an anode were introduced. The authors investigated that the relationship between the quench current and the layer thickness of deposited silver on the YBCO surface. And it was also observed whether the curvature radius for silver contact affected the value of quench current. Additionally, the contact area of the sample was analyzed with FEM. The analytical results may lead to the elucidation of a contact mechanism and a quench mechanism.

本文言語English
ホスト出版物のタイトル2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts, HOLM 2008
ページ319-324
ページ数6
DOI
出版ステータスPublished - 2008 12月 1
イベント54th IEEE Holm Conference on Electrical Contacts, HOLM 2008 - Orlando, FL, United States
継続期間: 2008 10月 272008 10月 29

出版物シリーズ

名前Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
ISSN(印刷版)0361-4395

Conference

Conference54th IEEE Holm Conference on Electrical Contacts, HOLM 2008
国/地域United States
CityOrlando, FL
Period08/10/2708/10/29

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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