Resistivity measurements of nanorods formed by electron beam-induced deposition

M. Shimojo; M. Takeguchi; R. Che; W. Zhang; M. Tanaka; K. Mitsuishi; K. Furuya

doi:10.1109/imnc.2005.203786

Resistivity measurements of nanorods formed by electron beam-induced deposition

M. Shimojo, M. Takeguchi, R. Che, W. Zhang, M. Tanaka, K. Mitsuishi, K. Furuya

研究成果: Conference contribution

本文言語	English
ホスト出版物のタイトル	Digest of Papers - Microprocesses and Nanotechnology 2005
ホスト出版物のサブタイトル	2005 International Microprocesses and Nanotechnology Conference
出版社	IEEE Computer Society
ページ	158-159
ページ数	2
ISBN（印刷版）	4990247221, 9784990247225
DOI	https://doi.org/10.1109/imnc.2005.203786
出版ステータス	Published - 2005
外部発表	はい
イベント	2005 International Microprocesses and Nanotechnology Conference - Tokyo, Japan 継続期間: 2005 10月 25 → 2005 10月 28

出版物シリーズ

名前	Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
巻	2005

Conference

Conference	2005 International Microprocesses and Nanotechnology Conference
国/地域	Japan
City	Tokyo
Period	05/10/25 → 05/10/28

ASJC Scopus subject areas

工学（全般）

文献へのアクセス

10.1109/imnc.2005.203786

他のファイルとリンク

引用スタイル

Shimojo, M., Takeguchi, M., Che, R., Zhang, W., Tanaka, M., Mitsuishi, K., & Furuya, K. (2005). Resistivity measurements of nanorods formed by electron beam-induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (pp. 158-159). Article 1595262 (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; Vol. 2005). IEEE Computer Society. https://doi.org/10.1109/imnc.2005.203786

Resistivity measurements of nanorods formed by electron beam-induced deposition. / Shimojo, M.; Takeguchi, M.; Che, R. その他.
Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. IEEE Computer Society, 2005. p. 158-159 1595262 (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; Vol. 2005).

研究成果: Conference contribution

Shimojo, M, Takeguchi, M, Che, R, Zhang, W, Tanaka, M, Mitsuishi, K & Furuya, K 2005, Resistivity measurements of nanorods formed by electron beam-induced deposition. in Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference., 1595262, Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference, vol. 2005, IEEE Computer Society, pp. 158-159, 2005 International Microprocesses and Nanotechnology Conference, Tokyo, Japan, 05/10/25. https://doi.org/10.1109/imnc.2005.203786

Shimojo M, Takeguchi M, Che R, Zhang W, Tanaka M, Mitsuishi K その他. Resistivity measurements of nanorods formed by electron beam-induced deposition. In Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. IEEE Computer Society. 2005. p. 158-159. 1595262. (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference). doi: 10.1109/imnc.2005.203786

Shimojo, M. ; Takeguchi, M. ; Che, R. その他. / Resistivity measurements of nanorods formed by electron beam-induced deposition. Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. IEEE Computer Society, 2005. pp. 158-159 (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference).

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