Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, M. Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

研究成果: Article › 査読

本文言語	English
ページ（範囲）	332-333
ページ数	2
ジャーナル	Microscopy and Microanalysis
巻	18
DOI	https://doi.org/10.1017/S1431927612003510
出版ステータス	Published - 2012 7月

ASJC Scopus subject areas

@article{cf8afa0d83a24019a5654f500f376c2e,

title = "Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique",

author = "M. Takeguchi and X. Zhang and A. Hashimoto and K. Mitsuishi and M. Shimojo and P. Wang and Peter, {N. D.} and Kirkland, {A. I.}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612003510",

language = "English",

volume = "18",

pages = "332--333",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

AU - Takeguchi, M.

AU - Zhang, X.

AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Shimojo, M.

AU - Wang, P.

AU - Peter, N. D.

AU - Kirkland, A. I.

PY - 2012/7

Y1 - 2012/7

UR - http://www.scopus.com/inward/record.url?scp=85007961670&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85007961670&partnerID=8YFLogxK

U2 - 10.1017/S1431927612003510

DO - 10.1017/S1431927612003510

M3 - Article

AN - SCOPUS:85007961670

SN - 1431-9276

VL - 18

SP - 332

EP - 333

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -