Spectroscopic ellipsometry study of In ₂O ₃ thin films

Engineering & Materials Science

• Crystal structure 23%
• Helicons 34%
• Magnetron sputtering 24%
• Optical band gaps 36%
• Optical transitions 38%
• Refractive index 24%
• Spectroscopic ellipsometry 100%
• Substrates 25%
• Temperature 14%
• Thin films 52%

Physics & Astronomy

• approximation 7%
• coefficients 14%
• configurations 7%
• crystal structure 10%
• curves 7%
• ellipsometry 53%
• energy 4%
• extinction 23%
• formulations 9%
• magnetron sputtering 11%
• optical transition 14%
• plots 11%
• refractivity 9%
• rooms 12%
• surface layers 11%
• temperature 8%
• thin films 28%
• voids 12%

Chemical Compounds

• Amorphous Material 25%
• Band Gap 13%
• Crystal Structure 9%
• Cubic Crystal 20%
• Ellipsometry 60%
• Energy 8%
• Liquid Film 26%
• Magnetron Sputtering 21%
• Optical Transition 25%
• Polycrystalline Solid 16%
• Refractive Index 17%
• Surface 5%