Structural characterization of shock-affected sapphire

M. Mazilu; S. Juodkazis; T. Ebisui; S. Matsuo; H. Misawa

doi:10.1007/s00339-006-3732-8

Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

研究成果: Article › 査読

27 被引用数 (Scopus)

抄録

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×10¹² cm^-2.

本文言語	English
ページ（範囲）	197-200
ページ数	4
ジャーナル	Applied Physics A: Materials Science and Processing
巻	86
号	2
DOI	https://doi.org/10.1007/s00339-006-3732-8
出版ステータス	Published - 2007 2月
外部発表	はい

ASJC Scopus subject areas

化学 (全般)
材料科学（全般）

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10.1007/s00339-006-3732-8

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AU - Matsuo, S.

AU - Misawa, H.

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AB - The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×1012 cm-2.

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Structural characterization of shock-affected sapphire

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