Study on reduction in radiated emissions from PCB using test LSI

Satoru Haga; Ken Nakano; Toshio Sudo; Osamu Hashimoto

doi:10.1002/mop.10732

Study on reduction in radiated emissions from PCB using test LSI

Satoru Haga, Ken Nakano, Toshio Sudo, Osamu Hashimoto

電気電子情報工学専攻

研究成果: Article › 査読

1 被引用数 (Scopus)

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Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

本文言語	English
ページ（範囲）	238-242
ページ数	5
ジャーナル	Microwave and Optical Technology Letters
巻	36
号	4
DOI	https://doi.org/10.1002/mop.10732
出版ステータス	Published - 2003 2月 20

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
原子分子物理学および光学
凝縮系物理学
電子工学および電気工学

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10.1002/mop.10732

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@article{d0c572044f564173b485cacbde6e17da,

title = "Study on reduction in radiated emissions from PCB using test LSI",

abstract = "Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.",

keywords = "Near electric field distribution, Near magnetic field distribution, Output buffer operation, Radiated emission, Test LSI",

author = "Satoru Haga and Ken Nakano and Toshio Sudo and Osamu Hashimoto",

year = "2003",

month = feb,

day = "20",

doi = "10.1002/mop.10732",

language = "English",

volume = "36",

pages = "238--242",

journal = "Microwave and Optical Technology Letters",

issn = "0895-2477",

publisher = "John Wiley and Sons Inc.",

number = "4",

}

TY - JOUR

T1 - Study on reduction in radiated emissions from PCB using test LSI

AU - Haga, Satoru

AU - Nakano, Ken

AU - Sudo, Toshio

AU - Hashimoto, Osamu

PY - 2003/2/20

Y1 - 2003/2/20

N2 - Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

AB - Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

KW - Near electric field distribution

KW - Near magnetic field distribution

KW - Output buffer operation

KW - Radiated emission

KW - Test LSI

UR - http://www.scopus.com/inward/record.url?scp=0037456220&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037456220&partnerID=8YFLogxK

U2 - 10.1002/mop.10732

DO - 10.1002/mop.10732

M3 - Article

AN - SCOPUS:0037456220

SN - 0895-2477

VL - 36

SP - 238

EP - 242

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

IS - 4

ER -

Study on reduction in radiated emissions from PCB using test LSI

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