抄録
Local structure around silicon and nitrogen atoms in Na-Si-O-N oxynitride glasses has been studied by means of 29Si MAS NMR spectroscopy. The NMR spectra have been analyzed on the assumption that the resonances of singly nitrided silicate tetrahedra shift towards less shielded direction by about 15 ppm compared with those of non-nitrided ones. It has been estimated that the number of silicon atoms around nitrogen is about 2.5, suggesting that about a half of the total nitrogen atoms may be bonded to two silicon atoms.
本文言語 | English |
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ページ(範囲) | 1292-1296 |
ページ数 | 5 |
ジャーナル | Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan |
巻 | 100 |
号 | 1167 |
DOI | |
出版ステータス | Published - 1992 |
外部発表 | はい |
ASJC Scopus subject areas
- セラミックおよび複合材料
- 化学 (全般)
- 凝縮系物理学
- 材料化学