TY - JOUR
T1 - The number of sub-pixel defects that is acceptable for various panel size and pixel sizes
AU - Hisatake, Yuzo
AU - Miyazaki, Tatsuya
AU - Yoshitake, Ryoji
AU - Nakano, Yoshihiko
PY - 2005
Y1 - 2005
N2 - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
AB - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
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U2 - 10.1889/1.2036454
DO - 10.1889/1.2036454
M3 - Conference article
AN - SCOPUS:32144458945
SN - 0097-966X
VL - 36
SP - 390
EP - 393
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
IS - 1
M1 - P-178
T2 - SID Symposium Digest of Technical Papers
Y2 - 29 July 2004 through 29 July 2004
ER -