抄録
Near-field scaning optical microscopy (NSOM) revealed many important features of semiconductor nanostructures. As such, the unprecedented high spatial resolution of NSOM was achieved recently and a stikingly new feature in the single-dot spectroscopy was reported. The observation was interpreted in terms of a kind of the dead-layer model which gives a qualitative interpretation, a more quantitative theory that was necessary to estimate the ratio of the FWHM of the spatial extent of both luminescence pattens and to understand the quantum-dot-size dependence of that ratio.
| 本文言語 | English |
|---|---|
| ページ | QThE3/1-QThE3/4 |
| 出版ステータス | Published - 2003 12月 1 |
| 外部発表 | はい |
| イベント | Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States 継続期間: 2003 6月 1 → 2003 6月 6 |
Other
| Other | Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) |
|---|---|
| 国/地域 | United States |
| City | Baltimore, MD. |
| Period | 03/6/1 → 03/6/6 |
ASJC Scopus subject areas
- 物理学および天文学（全般）