Thickness dependence of infra-red absorption enhancement for methanol on evaporated silver films

Y. Suzuki, H. Seki, T. Inamura, T. Tanabe, T. Wadayama, A. Hatta

研究成果: Conference article査読

19 被引用数 (Scopus)


The infra-red absorption intensity for the C-O stretch mode of methanol physisorbed at 90 K on 0.5-4-nm mass thickness silver films, deposited in UHV on to Ge substrates at 296 K, has been measured at normal incidence of radiation. The absorption intensity observed as a function of methanol exposure is normalized with respect to the corresponding intensity observed without silver to obtain an estimate of the absorption enhancement by the presence of silver. At any thickness of silver, the enhancement is at a maximum at an a exposure of less than 0.5 L; for silver films at 1 and 2 nm, the absorption intensity is more than 20 times larger than that observed without silver, though a substantial enhancement is observed at larger exposures. The exposure dependence is rather different on 3- and 4-nm-thickness silver films that exhibit an enhancement of ca. 10 at maximum. On the basis of the surface morphology of the silver films, the observed enhancement features are consistent with the view that collective electron resonances are involved in the absorption enhancement.

ジャーナルSurface Science
出版ステータスPublished - 1999 6月 1
イベントProceedings of the 1998 9th International Conference on Vibrations at Surfaces (VAS9) - Kanagawa-ken, Jpn
継続期間: 1998 10月 121998 10月 16

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学


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