抄録
Although scanning confocal electron microscopy (SCEM) shows a promise for optical depth sectioning with high resolution, practical and theoretical problems have prevented its application to three-dimensional (3D) imaging. We employed a stage-scanning system in which only the specimen is moved three dimensionally under a fixed lens configuration, and an annular dark-field (ADF) aperture which blocks direct beams and selects only the scattered electrons. This ADF-SCEM improved depth resolution sufficiently to perform optical depth sectioning. Finally, we succeeded in demonstrating the 3D reconstruction of carbon nanocoils using ADF-SCEM.
本文言語 | English |
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論文番号 | 086101 |
ジャーナル | Journal of Applied Physics |
巻 | 106 |
号 | 8 |
DOI | |
出版ステータス | Published - 2009 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(全般)