Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

X. Zhang; X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P Kirkl; ;M. Tezuka;M. Shimojo

Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

X. Zhang, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P Kirkl, ;M. Tezuka;M. Shimojo

機能制御システム専攻

研究成果: Article › 査読

本文言語	English
ページ（範囲）	159-169
ジャーナル	J. Electron Microsc.
巻	61
出版ステータス	Published - 2012 12月 1

引用スタイル

@article{b90ff869326c45109bfab43500cef7c3,

title = "Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy",

author = "X. Zhang and Kirkl, {X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P} and Shimojo, {;M. Tezuka;M.}",

year = "2012",

month = dec,

day = "1",

language = "English",

volume = "61",

pages = "159--169",

journal = "J. Electron Microsc.",

}

TY - JOUR

T1 - Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

AU - Zhang, X.

AU - Kirkl, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P

AU - Shimojo, ;M. Tezuka;M.

PY - 2012/12/1

Y1 - 2012/12/1

M3 - Article

VL - 61

SP - 159

EP - 169

JO - J. Electron Microsc.

JF - J. Electron Microsc.

ER -